In X-ray crystallography, which is commonly used in diffractometers, X-ray radiation with a wavelength of approximately 1 angstrom (Å) or 0.1 nanometers (nm) is typically employed. This corresponds to X-rays with a frequency of approximately 3 × 10^17 hertz (Hz). This wavelength is well-suited for studying the atomic structure of crystals because it interacts with the crystal lattice in a way that produces a diffraction pattern, allowing researchers to determine the arrangement of atoms within the crystal.